gooddeaduser Posted August 1, 2008 Posted August 1, 2008 http://cisco.com/en/US/ts/fn/200/fn25994.html Single event upset(SEU) failures are often caused by the following: * Alpha particles emitted by radioactive packaging and wafer processing materials on synchronous random-access memory (SRAM) and dynamic random-access memory (DRAM) products. * Thermal neutron from cosmic radiation of energy less then 15ev. * Terrestrial high energy cosmic particles, neutrons, protons, pions and muons. Вставить ник Quote
Солнечный КОТ Posted August 1, 2008 Posted August 1, 2008 Неплохие отмазки, хрен проверишь. Последние 2. Вставить ник Quote
Ruslan_R Posted August 1, 2008 Posted August 1, 2008 Они еще забыли написать про нейтрино, которые при попадании в циску пробивают ее навылет :) Вставить ник Quote
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