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Posted

http://cisco.com/en/US/ts/fn/200/fn25994.html

Single event upset(SEU) failures are often caused by the following:

* Alpha particles emitted by radioactive packaging and wafer processing materials on synchronous random-access memory (SRAM) and dynamic random-access memory (DRAM) products.

* Thermal neutron from cosmic radiation of energy less then 15ev.

* Terrestrial high energy cosmic particles, neutrons, protons, pions and muons.

 

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